Semiconductor
R, C, L, Z, Q
Measurement Sources
 |
Component Test (also see Analyzers: Impedance)
|
Semiconductor:
|
| Huntron |
2000 |
Tracker Circuit Tester |
| Huntron |
5000 |
Computer Controlled Troubleshooter/Tracker Circuit
Tester |
| Tektronix |
576 |
1500V, 220W Max, Curve Tracer |
| Tektronix |
577 |
1600V, 65W Max Storage Curve Tracer |
R, C, L, Z, Q:
|
| ESI |
2160 |
20Hz-150kHz Videobridge w/Microcassette Drive |
| Genrad |
1657 |
120Hz/1kHz RLC Digibridge |
| Genrad |
1658 |
0.1%, 120Hz/1kHz RLC Digibridge |
| Genrad |
1688 |
234Hz-20kHz LC Digibridge/IEEE-488 BS |
| HP / Agilent |
16047A |
Component Test Fixture for HP /
Agilent 4263B,
4268A, 4279A, 4284A, 4285A, 4288A,
4294A, 4192A, 4194A, 4263A, 4278A |
| HP / Agilent |
16334A |
Designed for Impedance Evaluations of SMD |
| HP / Agilent |
16339A |
Component Test Fixture for HP /
Agilent 4339A |
| Wayne Kerr |
3220A |
Bias Unit for 3245 Precision Inductance Analyzer |
| Wayne Kerr |
3245 |
Precision Inductance Analyzer |
Measurement Sources:
|
| Keithley |
220 |
500fA-100mA Programmable Current Source |
| Keithley |
224 |
5nA-100mA Programmable Current Source |
| Keithley |
228A |
1mV-100V, 100uA-10A Programmable Voltage/Current Source |
| Keithley |
230 |
±50µV to ±101V Programmable Voltage Source |
| Keithley |
261 |
10fA-11mA Dual Polarity Current Source |
|
