Used with the Teseq / Schaffner NSG 5000 System |
|
Burst
Pulse Generator
Fast transient interference signals injected onto a
vehicle's wiring harness through switching of associated peripheral
devices can affect the correct functioning of adjacent electronic units.
In conformance with the standards (ISO/SAE pulse 3a/3b), the NSG 5003
simulates these interference phenomena by means of pulse bursts. The
vibrant development of electronic devices for the automotive industry
means that better and faster test methods are required. The burst
generator more than meets these increasing demands; its technical
properties exceeding the specifications laid down in the standards by
several factors. Higher pulse voltages, burst frequencies and pulse burst
specifications are just part of it; there are also automated functions for
weak spot analyses and long-term trials.
The EUT connection, as well as the separate connector
for the coupling clamp used in data line tests, has been optimized to suit
the high frequency conditions prevailing in such a fast pulse environment.
Technical Specifications
| Pulse amplitude |
Impedance |
Pulse rise time |
Burst frequency |
Pulses per burst |
Burst repetition |
Pulse modes |
Pulse duration |
| 20 to 800V in 1V
steps |
50Ω |
5ns |
1 to 100kHz in 0.1kHz steps |
1 - 200 |
90ms to 99.9
seconds in 10ms steps |
Single, continuous, programmed 1 to 99999 |
100ns (into 50Ω) |
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