Perform bit error rate testing on in-service DS1 and DS0 circuits, regardless of framing or line code, without disrupting the live traffic.

• Patented Live Data Analysis (LDA) technology performs bit error rate testing on live traffic
• Test T1, Fractional T1, DS0 circuits for bit errors from non-intrusive T1 access points
• Troubleshoot intermittent, time-specific, and data-dependent problems with time-stamped results
• Sectionalize a problem to minimize circuit downtime

Featured Test Equipment:

Haefely ECOMPACT4
Transient Immunity Test

Voltech PM6000
Power Analyzer

IFI T4026-40
TWT Amplifier

Teseq NSG 438
ESD Gun

Solar 2654
Transient Generator