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Teseq / Schaffner NSG 5000 EMC Test System for Automotive Electronics

The above Teseq/ Schaffner NSG 5000 System Chassis is shown with the Schaffner NSG5003 Burst Generator, the Schaffner NSG5041 Transient Generator and the Schaffner NSG5005A High Energy Pulse Generator

Teseq / Schaffner NSG 5000 EMC Test System for Automotive Electronics

The compact and modular EMC Test System NSG 5000 offers all the generators necessary for tests with pulsed interference as well as voltage variations as called for by ISO and SAE. The established test specifications for passenger cars together with the new standards for commercial vehicles published by the ISO, SAE, DIN and other bodies are fully covered, as are the many company specific standards from larger vehicle manufacturers. The construction adopted enables trends in the standards and changing market requirements to be followed consistently through the introduction of new developments or upgrades to the generator modules.

This compact mainframe houses the common system components and accommodates all the standard pulse generators such as the Schaffner NSG5001, the Schaffner NSG5003 and the Schaffner NSG5005. A high performance processor controls all the real-time tasks, takes care of system integrity, assures the monitoring of the EUT path and handles communication with the Windows-based user interface. Besides the control unit, the power supply, high voltage unit and control electronics for the EUT are all housed in a package mounted at the rear of the mainframe. This modularity provides the flexibility to adapt to changing requirements. The front of the chassis is available for the insertion of various pulse generators and for the connection and practical handling of test objects. Interrupt-free test sequences comprising all types of pulse at one and the same EUT connector are made possible through the use of a high voltage pulse bus configuration. An electronic switch to connect and disconnect the battery supply is incorporated in the NSG 5000.

In its standard configuration, the equipment is rated for testing objects at up to 30V / 25A dc or 48V / 10A dc. The test rig and the power sources are protected by built-in, over-current trip switches. Additional inputs and outputs are located on the rear panel for test execution control purposes and the monitoring of error signals, oscilloscope triggers, gate start/stop commands, etc.  Larger systems can be created by installing further generators in an expansion chassis and these generators are instantly recognized by the software and are embodied automatically in the system. Overall control is effected via a PC running under Windows.

Teseq / Schaffner NSG 5000 Specifications:

Instrument power supply 100 to 120Vac ±10%, 47-63Hz
220 to 240Vac ±10%, 47-63Hz
Dimensions 19" benchtop housing, can also be rack mounted; Height 31cm (12.2"), Depth 51cm (20")
EUT supply From an external source, e.g. battery or NSG 5004A battery simulator 48Vdc, 25A max. continuous Sensor for voltage correction Program-controlled switching 30A safety cut-out
Computer interface RS 232C or IEEE 488
Control connections EUT failure / Start-Stop / Test end / Trigger for oscilloscope

Optional Pulse Generator Specifications

NSG 5001A Surge Pulse Generator
Pulse Amplitude 10 to 600V in 1V steps
Impedance 2/4/10/50Ω and external (pulse 1/2) 10/30Ω (pulse 6)
Pulse Rise Time 1/3µs (pulse 1/2) 60µs (pulse 6)
Pulse Duration 50/200/500/ 1000/2000µs (pulse 1/2) 300µs (pulse 6)
Pulse modes Single, continuous, programmed 1 to 99999
Repetition 0.2 15s
Battery supply activation Program-controlled,  Voltage-controlled
Pulse Monitor 1:100, BNC
NSG 5003 Burst Pulse Generator
Pulse Amplitude 20 to 800V in 1V steps
Impedance 50Ω
Pulse Rise Time 5ns
Pulse Duration 100ns (into 50Ω)
Burst frequency 1 to 100kHz in 0.1kHz steps
Pulses Per Burst 1 - 200
Burst Repetition 90ms to 99.9 seconds in 10ms steps
Pulse Modes Single, continuous, programmed 1 to 99999
NSG 5005A High Energy Pulse Generator
Pulse Amplitude 20 to 200V in 0.5V steps; Clamping: 20-180V
Impedance According to resistor fitted
Pulse Rise Time 0.1 to 10ms
Pulse Duration 30 - 700ms
Pulse Repetition 15 to 600s in 0.1s steps
Pulse Modes Single, continuous, programmed 1 to 99999
Pulse Monitor 1:100, BNC
INA 5025, HardwareImpedance 0.5 to 10Ω in 0.25Ω steps
NSG 5005B High Energy Pulse Generator
Energy Source 200mF capacitor charged to 60V
Pulse Amplitude 20 to 120A, in 1A steps (84A into 0.6Ω reference load)
Pulse Rise Time 5 - 10ms
Pulse Duration 40/100/150/200/250/300/350/400ms
Pulse Repetition 25 to 600s in 0.1s steps
Pulse Modes Single, continuous, programmed 1 to 99999
NSG 504 Surge Pulse Generator
  Pulse Amplitude Impedance Rise Time  Pulse Duration Repetition Polarity
Pulse 1 20 200 V 10, 20, 50 Ohms 1, 3 µs 2 ms 0.5 5 s -
  150 600 V 20 Ohms 1 µs 1 ms 0.5 5 s -
Pulse 1 (24 V) 150 600 V 50 Ohms 3 μs 1 ms 0.5 5 s -
Pulse 1 (50 μs) 12 220 V 2, 10, 50 Ohms 1 μs 50 us 0.2 5 s -
Pulse 2 12 220 V 2, 10, 20, 50 Ohms 1 μs 50 us 0.2 5 s +
Pulse 6 10 500 V 30 Ohms < 60 μs 300 us 0.5 15 s -
CI 220-A 20 110 V 10 Ohms 1 μs 2 ms 0.5 5 s   
CI 220-B 30 300 V 4 Ohms 1 μs 50 us 0.2 5 s  
CI 220-C 20 150 V 4 Ohms 1 μs 50 us 0.2 5 s  

Please contact us for more information on the Teseq / Schaffner NSG 5000 EMC Test System for Automotive Electronics

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