Com-Power PS-400 Near Field Probe Set
The Com-Power PS-400 Near Field probe set consists of two E-Field
probes and a H-Field probe for board level radiated emissions testing. One
of the two E-field probes is patented. It has a fine tip that allows
noise measurement of pins on ICs and traces as narrow as 3 mils on a printed
circuit board. The other E-field probe is used to find the vicinity of the
highest emissions levels on the board. This probe has a higher amplitude
sensitivity than the fine tip probe.
Once the location of the possible sources of EMI (Electromagnetic
interference) is detected using this probe, the fine tip probe can assist
the design engineer to pinpoint the exact circuit that might be causing the
EMI.
Using these two probes in combination the design engineer can quickly
find and suppress the EMI at the source, before resorting to other means of
EMI suppression. The Loop probe allows detection of magnetic noise emanating
from chassis seams, ribbon cables and connector pins.
| Type |
Tip Probe |
Stub Probe |
Loop Probe |
| Frequency Range |
30 MHz - 600 MHz |
20 MHz - 1000 MHz |
300 kHz - 100 MHz |
| Impedance |
50 Ohm |
50 Ohm |
50 Ohm |
| Connector |
BNC |
BNC |
BNC |
| Dimensions ( L x W) inches |
3.8 x 0.6 |
3.9 x 0.6 |
4.8 x 0.6 |
| Loop Diameter inches |
N/A |
N/A |
0.75 |
|
