|
|
Semiconductor Parameter Analyzer
- Fully automatic, high speed dc characterization of semiconductor devices and
materials
- Programmable stimulus/measurement units capable of high resolution, wide range
sourcing and sensing
- Built-in graphics analysis functions
- marker and cursor provide direct numeric readouts
- line function for automatic calculation of line gradient and X, Y axes intercept
values
- Built-in disc drive for permanent storage of user programs and measurement
results (MS-DOS or LIF format)
- Output via HPIB, parallel or network 10 Base-T interface.
- Perform measurement & analysis with built-in HP / Agilent Instrument BASIC
- Built-in Self Test & Auto Calibration
System Configuration
- 4 Medium Power Source Monitor Units (MPSMU)
* 10fA/2µV to 100mA/100V
- 2 Voltage Monitor Units (VMU)
- 2 Voltage Source Units (VSU)
Optional Equipment
- 41501B SMU and Pulse Generator Expander
- 16440A SMU/Pulse Generator Selector
- 16441A R-Box
- 16442A Test Fixture
- Stimulus measurement unit (SMU): four SMUs are built into the HP / Agilent 4155B.
Each SMU can be programmed to source voltage and monitor current, or conversely to
source current and monitor voltage
|
