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Home > Equipment > Electrical Test Equipment > Hipot/UL/Electrical Testers > Hipot Testers (0-9.99 kV)
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Associated Research 7564SA

Associated Research 7564SA Quadchek II
4-in-1 AC/DC Hipot, Insulation Resistance & Ground Bond Tester

Associated Research 7564SA Features:

  • GPIB (IEEE-488), RS-232 or Printer Interfaces
  • Available in 500 VA Output Versions
  • Optional Built-In & External Scanner Capabilities

  • Output of all Test Data can be Viewed Through a Single LCD Display
  • Interconnects to the RUNCHEK. Functional Run Test System or the LINECHEK. Line Leakage Tester to Form a Complete Test System
  • Patented RAMP HI/CHARGE LO Circuit for Efficient DC Testing
  • Perform all Tests Through a Single DUT (Device Under Test) Connection
  • Designed to Meet Safety Agency Standards such as UL, CSA, IEC, VDE, ToV and the European Norms including the Low Voltage Directive 73/23/EEC

Associated Research 7564SA Specifications:

Voltage 115/230 V AV ±15%, single phase, user selectable
Frequency 47 Hz - 63 Hz
Fuse 6.3 Amp 250 V Slo-Blo
Dielectric Withstand Test Mode
Output Rating 5 kVAC @ 40 mA, 6 kV DC @ 10 mA
Output Adjustment Range: 0 - 5 kV AC or 0 + 6 kV DC
Resolution: 1 Volt/steps
Ramp Hi (DC) Range: 12 mA peak max., ON/OFF selectable
Charge Lo (DC) Range: 0.0 - 350 μA or auto set
Hi-Limit (AC) Range: 0.00 - 40.00 mA
Resolution: 0.01 mA/steps
Accuracy: ±(2% of setting 2 counts)
ARC Detection Range: 1-9
Failure Detector Audible and Visual
DC Output Ripple ≤4% Ripple RMS at 6 kV DC @ 3.5 mA, Resistive Load
AC Output Wave Form Sine Wave, Crest Factor = 1.3 - 1.5
Output Frequency Range: 60 or 50 Hz, User Selectable
Accuracy: ±1%
Output Regulation ±(1% of setting + 5 volts) from no load to full load
Dwell Timer Range: 0, 0.3 - 999.9 sec. (0 = constant)
Resolution: 0.1 sec. increments
Accuracy: ±0.1% + 0.05 sec.)
Ramp Timer Range: AC 0.1 - 999.9 sec.; DC 0.4 - 999.9 sec
Resolution: 0.1 sec. increments
Accuracy: ±(0.1% + 0.05 sec.)
Insulation Resistance Test Mode
Output Voltage Range: 100 VDC - 1000 VDC
Resolution: 1 volt/steps
Accuracy: ±(2% of setting + 2 volts)
Short Circuit Current Max.: 12 mA peak
Voltage Display Range: 0 -1000 V
Resolution: 1 volt/steps
Accuracy: ±(2% of setting + 2 counts)
Charge Lo Range: 0.000 - 3.500 μA or Auto Set
Hi-Limit Range: 0 - 9999 MΩ (0 = Off)
Lo-Limit Range: 1 - 9999 MΩ
Delay Timer Range: 0, 0.5 - 999-9 sec. (0 = constant)
Resolution: 0.1 sec./steps
Accuracy: ±(0.1% + 0.05 sec.)
Ground Bond Test Mode
Output Voltage (Open Circuit Limit) Range: 3.00 - 8.00 VAC
Resolution: 0.01 volt/steps
Accuracy: + (2% of Setting + 0.03 V)
Output Frequency Range: 60 or 50 Hz, User Selectable
Accuracy: ±1%
Output Current Range: 3.00 - 30.00 Amps
Resolution: 0.01 volt/steps Accuracy: ±(2% of setting + 0.02 A)
Current Display Range: 0.00 - 30.00 Amps
Resolution: 0.01 amps/steps
Accuracy: + (3% of reading + 0.03 A)
Resistance Display Range:  0 - 600 mΩ
Resolution: 1 mΩ/steps
Accuracy: + (2% of setting + 2mΩ) 
Hi/Lo Limit Range: 0-600 mΩ for 3-10 A; 0-150 mΩ for 3-30 A
Resolution: 1 mΩ/steps
Accuracy: + (2% of Setting + 2 mΩ) 
Dwell Timer Range: 0, 0.5 - 999.9 sec. (0 = constant)
Resolution: 0.1 sec./steps
Accuracy: + (0.1% + 0.05 sec.) 
Milliohm Offset Max. Offset Capability: 200 mΩ
Resolution: 1 mΩ/steps
Accuracy: + (2% of Setting + 2 mΩ) 

Please contact us for more information on the Associated Research 7564SA Quadchek II

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