Data Acquisition (25AD3 8 Channel card included)

• Vertical Amplifiers Input: 8 analog channels with independent A/D converters for simultaneous acquisition and 8 digital event channels.
• Channel Type: Single-ended or differential,  selectable per channel
• Input Ranges: ±100 mV to ±100 V Full Scale in 1, 2, 5 sequence
• Vertical Resolution: 12 bit
• Input Impedance: 1 MΩ
• DC Offset ±15 V: minus the selected FS range from ±100 mV to ±10 V ranges
• DC Offset ±150 V: minus the selected FS range from ±20 V to ±100 V ranges
• CMRR: -60 dB at 100 Hz (up to ±10 V)
• Crosstalk: -40 dB at 100 Hz
• Acquisition Memory: 64 K samples per channel (standard) 512 K and 1 M samples per channel (optional)
• Time Base Sample Rate: 1 S/min to 100 KS/s
• Resolution: 10 µsec per point minimum. Selectable in increments of: 10 µsec up to 100 ms, 1 ms up to 60 sec
• External Clock: Full range of sample rate
• Trigger Level Range: 100% of full scale (plus offset)
• Level Resolution: 0.5% of full scale
• Slope: +, -, Either, or Off
• Window Mode: Yes
• Programmability: Logical OR, Logical AND combination of individual trigger criteria from each channel (analog or digital)
• Pretrigger Range: Pretrigger and record length are selectable in 1 sample increments

Data Archiving

• All saved tests are time and date stamped and stores with setup parameters on internal hard drive or floppy disk.

Applications:

• Mechanical System and Component Testing

• Manufacturing Process Development, Documentation and Troubleshooting in the Semiconductor, Steel and Plastics Industries.

• Electrical Power Distribution and Switching

• Fluid Power Control Systems

Features:

• Up to 16 channels in a briefcase size package

• Simultaneous Acquisition of 2 to 48 Differential Analog Channels

• Records up to 1 million Samples per Channel

• Visual Analysis and Custom User-Entered Formulas

• Read Signal Magnitudes in Engineering Units

• Multi-Tests with Multi-Channels Conveniently Organized and Presented

Data Analysis

• View up to 16 channels simultaneously

• View stored data with newly acquired data in stacked, overlay or X-Y display formats

• Zoom and pan data

• Dual cursors for precise signal magnitude and event relationship measurements

• Read magnitudes in engineering units

• Analyze data with waveform mathematics

• No programming necessary

• Built-in waveform mathematical functions include + - * / ^, sine, cos, tan, differentiate, integrate, Log₁₀, Ln, RMS, Standard Deviation, FFT and many more

• Export data and set-up parameters to host computers

• Export Formats: WKS, ASCII, Binary, DADisp and user defined

Data Management

• Save test parameters, notes and data in spreadsheet-like format

• Waveforms within tests are easily added to the display for viewing with other saved data or with newly acquired data

• Documentation notes can be printed as hardcopy for indexing purposes

Hard Copy & Report Generating

• Hardcopy Options: Dot-matrix printer (single button-press to initiate copy) or plotter (HPGL format)

• Waveforms may be printed or plotted to a file for later printing/plotting or for importing into word processing programs for report generation

Please contact us if you need further information.