a division of Advanced Test Equipment Corporation 800-404-ATEC (2832)

Features:

• Fully automatic, high speed dc characterization of semiconductor devices and materials
• Four programmable stimulus/measurement units capable of high resolution, wide range sourcing and sensing...I: 1 pA ~ 100 mA: 1 mV ~ 100 V
• Built-in graphics analysis functions
  - marker and cursor provide direct numeric readouts
  - line function for automatic calculation of line gradient and X, Y axes intercept values
• Built-in flexible disc drive for permanent storage of user programs and measurement results
• Stimulus measurement unit (SMU): four SMUs are built into the HP / Agilent 4145A.   Each SMU can be programmed to source voltage and monitor current, or conversely to source current and monitor voltage

Optinal Accessories:

HP / Agilent 16058A: Test Fixture