HP Agilent 4155B SemiConductor Parameter Analyzer
Features:
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Fully automatic, high speed dc characterization of semiconductor devices and materials
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Programmable stimulus/measurement units capable of high resolution, wide range sourcing and sensing
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Built-in graphics analysis functions
- marker and cursor provide direct numeric readouts
- line function for automatic calculation of line gradient and X, Y axes intercept values
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Built-in disc drive for permanent storage of user programs and measurement results (MS-DOS or LIF format)
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Output via HPIB, parallel or network 10 Base-T interface.
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Perform measurement & analysis with built-in HP / Agilent Instrument BASIC
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Built-in Self Test & Auto Calibration
System Configuration:
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4 Medium Power Source Monitor Units (MPSMU)
* 10fA/2µV to 100mA/100V
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2 Voltage Monitor Units (VMU)
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2 Voltage Source Units (VSU)
Optional Equipment:
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41501B SMU and Pulse Generator Expander
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16440A SMU/Pulse Generator Selector
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16441A R-Box
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16442A Test Fixture
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Stimulus measurement unit (SMU): four SMUs are built into the HP / Agilent 4155B. Each SMU can be programmed to source voltage and monitor current, or conversely to source current and monitor voltage