HP Agilent 4155B SemiConductor Parameter Analyzer

HP/Agilent 4155B Semiconductor Parameter Analyzer
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Features:

  • Fully automatic, high speed dc characterization of semiconductor devices and materials
  • Programmable stimulus/measurement units capable of high resolution, wide range sourcing and sensing
  • Built-in graphics analysis functions
    - marker and cursor provide direct numeric readouts
    - line function for automatic calculation of line gradient and X, Y axes intercept values
  • Built-in disc drive for permanent storage of user programs and measurement results (MS-DOS or LIF format)
  • Output via HPIB, parallel or network 10 Base-T interface.
  • Perform measurement & analysis with built-in HP / Agilent Instrument BASIC
  • Built-in Self Test & Auto Calibration

 

System Configuration:

  • 4 Medium Power Source Monitor Units (MPSMU)
    * 10fA/2µV to 100mA/100V
  • 2 Voltage Monitor Units (VMU)
  • 2 Voltage Source Units (VSU)

 

Optional Equipment:

  • 41501B SMU and Pulse Generator Expander
  • 16440A SMU/Pulse Generator Selector
  • 16441A R-Box
  • 16442A Test Fixture
  • Stimulus measurement unit (SMU): four SMUs are built into the HP / Agilent 4155B.   Each SMU can be programmed to source voltage and monitor current, or conversely to source current and monitor voltage