Tektronix DTG5274 Data Timing Generator

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Tektronix Test Equipment DTG5274
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DTG5274 Datasheet
The Tektronix DTG5274 Data Timing Generator combines the power of a data generator with the capabilities of a pulse generator in a versatile, benchtop form factor, shortening the duration of complex test procedures and simplifying the generation of low-jitter, high-accuracy clock signals or serial data across multiple channels. Its modular platform allows you to easily configure the performance of the instrument to your existing and emerging needs to minimize equipment costs. Eight low-current, independently controlled DC outputs can substitute for external power supplies. The Tektronix DTG5274 Data Timing Generator incorporates a full compliment of auxiliary input and output channels to easily integrate with other instruments, such as oscilloscopes and logic analyzers, to create a flexible and powerful lab.
Tektronix Test Equipment DTG5274 Features
  • 2.7 GB/s, 4 slot mainframe
  • From 2 to 96 Data Channels (Master/Slave) and Close to 1,000 Through Clock Synchronization
  • Class Leading Delay Resolution and Range
    • 0.2 ps
    • Up to 600 ns of Total Delay
  • Versatile Platform Combines Features of Data Generator, Pulse Generator, and DC Source
  • Advanced Control over Signal Parameters to Meet Most Current Testing Needs; Like Stressed Eye Generation
    • Built-in Jitter Generation and Crossing Point Control
    • Level Control with 5 mV Resolution
    • Variable Edge Slew Rates
  • Easy to Use and Learn Shortens Time to Test
    • Plug-in Modules Easily Configure Instrument to Your Needs
    • Intuitive User Interface Based on Windows 2000
    • Convenient Benchtop Form Factor
  • Up to 32 Mbit Pattern Depth Supports Long Data Patterns
Tektronix Test Equipment DTG5274 Applications
  • Semiconductor Device Functional Test and Characterization
    • Support for Semiconductor Technologies from TTL to LVDS
    • Initial Verification and Debugging, Comprehensive Characterization, Manufacturing, and Quality Control
  • Compliance and Interoperability Testing to Emerging Standards
    • PCI-Express Gen1:2.5 Gbps
    • Serial ATA Gen1/2:1.5 Gbps/3 Gbps
    • InfiniBand 2.5 Gbps
    • XAUI: 3.125 Gbps
    • HDMI: Version 1.3 / DVI
  • Magnetic and Optical Storage Design
    • Research, Development, and Test of Next-generation Devices (HDD, DC/DVD, Blu-ray)
  • Data Conversion Device Design
    • Characterization and Test of Next-generation D/A Convertors
  • Imaging Sensor Device Design
    • Characterization and Functional Testing of Next-generation Imaging Devices (CCD/CMOS)
  • Jitter Transfer and Jitter Tolerance Testing