The Tektronix MDO4034-3 Mixed Domain Oscilloscope provides 4 analog channels of 350 MHz bandwidth with a 1 ns rise time. This unit offers an RF channel frequency range from 50 kHz to 3 GHz. Capture time-correlated analog, digital, and RF signals for a complete view of your device systems. See both the time and frequency domain in a single glance, and view the RF spectrum at any point in time to see how it changes over time or with the state of your device. A single capture includes the same spectral content as approximately 1,500 unique test setups and acquisitions on a traditional spectrum analyzer. Solve complicated design issues quickly and efficiently with an oscilloscope integrated into your design.
The MDO4000 Series sophisticated interface is ideal for testing environments. A fast waveform capture rate – greater than 50,000 waveforms per second – enables you to see glitches and other infrequent transients within seconds, revealing the true nature of device faults. A digital phosphor display with intensity grading shows the history of a signal’s activity by intensifying areas of the signal that occur more frequently, providing a visual display of just how often anomalies occur. Traditional oscilloscope FFTS do not display FFT and the desired view of the domain signals of interest simultaneously. Supplying both mixed-domain and spectral analysis, the MDO4034-3 provides 16 digital channels, and its MagniVu™ high-speed acquisition displaying a 60.6 ps fine timing resolution. Correlating events, observing interactions, or measuring timing latencies between the two domains is exceptionally easy, giving you quick insight into your design’s operation.
The Tektronix MDO4034-3 is the second model in the
Tektronix MDO4000 Series.
Tektronix Test Equipment MDO4034-3 Features
- Mixed-domain analysis
- Time-correlated analog, digital, and RF signal acquisitions in a single instrument
- Wave Inspector controls provide easy navigation of time-correlated data from both the time and frequency domains
- Amplitude, frequency, and phase vs. time waveforms derived from RF input
- Selectable spectrum time to discover and analyze how RF spectrum changes over time - even on a stopped acquisition
- Spectral analysis
- Dedicated front-panel controls for commonly performed tasks
- Automated peak markers identify frequency and amplitude of spectrum peaks
- Manual markers enable non-peak measurements
- Trace types Include: Normal, Average, Max Hold, and Min Hold
- Detection types include: +Peak, -Peak, Average, and Sample
- Spectrogram display enables easy observation and insight into slowly changing RF phenomena
- Automated measurements include: Channel Power, Adjacent Channel Power Ratio (ACPR), and Occupied Bandwidth (OBW)
- Trigger on RF power level
- Triggered or Free Run spectral analysis
- Optional serial triggering and analysis - serial protocol trigger, decode, and search for I2C, SPI, USB, Ethernet, CAN, LIN, FlexRay, RS-232/422/485/UART, MIL-STD-1553, and I2S/LJ/RJ/TDM 10.4 in. (264 mm) bright XGA color display Small footprint and lightweight - Only 5.8 in. (147 mm) deep and 11 lb. (5 kg)Wave Inspector® Controls provide easy navigation and automated search of waveform data
Tektronix Test Equipment MDO4034-3 Specs
| Analog channels |
4 |
| Analog channel bandwidth |
350 MHz |
| Rise time |
1 ns |
| Sample rate (1 ch) |
2.5 GS/s |
| Sample rate (2 ch) |
2.5 GS/s |
| Sample rate (4 ch) |
2.5 GS/s |
| Record length (1 ch) |
20M |
| Record length (2 ch) |
20M |
| Record length (4 ch) |
20M |
| Digital channels |
16 |
| RF channels |
1 |
| RF channel frequency range |
50 kHz - 3 GHz |