TTC LDA2000 DS1 and DS0 Circuits Tester

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TTC LDA2000 Circuits Tester (LDA)
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Perform bit error rate testing on in-service DS1 and DS0 circuits, regardless of framing or line code, without disrupting the live traffic.
TTC LDA2000 Features
  • Patented Live Data Analysis (LDA) technology performs bit error rate testing on live traffic
  • Test T1, Fractional T1, DS0 circuits for bit errors from non-intrusive T1 access points
  • Troubleshoot intermittent, time-specific, and data-dependent problems with time-stamped results
  • Sectionalize a problem to minimize circuit downtime