ZEISS Handysurf+ Surface Roughness Tester Series

Quote Add-Ons

Tech Support
(800) 404-2832

With Every
Rental

Worldwide
Delivery

ZEISS Handysurf+ Surface Roughness Tester Series

Larger

Categories

Surface Roughness Testers

Documents

Datasheet

The ZEISS Handysurf+ Surface Roughness Tester is a mobile surface measuring instrument that provides a sleek design, a 2.4-inch color LCD screen, and an improved user interface for intuitive operations. ZEISS Handysurf+ instruments offer a simple assurance option for measuring surface parameters throughout production. Handysurf+ surface roughness testers are an ideal solution for the automotive, mechanical engineering and medical technology industries. ZEISS Handysurf+ are designed with horizontal, vertical and overhead surface measurement capabilities that travel to the workpiece. Handysurf+ measuring instruments cover a 370 µm measuring range, making it the widest in its class without compromising its 0.0007 µm resolution.

The ZEISS Handysurf+ Surface Roughness Tester is available in three models: 35, 40 and 45, with stylus tip radiuses of 2 or 5 µm (45 only available with 5 µm stylus tip radius).

Specifications
Features
Applications
Options
Accessories
Standards
Videos

Features

Easy-to-use, mobile and flexible for measuring, analysis and logging
Compact design
Work quickly using the automatic function for the measuring range, total path, cut-off and magnification
Can be connected to any ZEISS 3D measuring machine via a ZEISS CALYPSO interface
Surface analyses in accordance with many common standards: ISO, DIN, CNOMO, ASME and JIS
Interface connects to separate analysis computer
Measure in various positions: horizontally, vertically and overhead
Optional horizontal tracing driver to measure in the axial direction in tight spaces
Resolution: up to 10 nanometers
Extensive accessories (printer, columns, extensions, cables, printer paper)

Specifications

Models
Tip radius	35 Tip radius 5 μm	35 Tip radius 2 μm	40 Tip radius 5 μm	40 Tip radius 2 μm	45 Tip radius 5 μm
Measurement range
Z direction	-210 to +160 μm	-210 to +160 μm	-210 to +160 μm	210 to +160 μm	210 to +160 μm
Drive axis	X direction 16 mm	X direction 16 mm	X direction 16 mm	X direction 16 mm	Y direction 16 mm
Analysis item
Parameter profile curve	Pt, Rmax, Rz, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tp
Roughness curve	Ra, Rq, Rz, Rv, Rc, Rt, RSm, RΔq, Rsk, Rku, Rmr(c), Rmr, Rδc, Rz94, R3z, RΔa, Ry, Sm, S, tp, PC, RPc JIS, RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, Δa, Δq, Htp
Motif	R, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, K
Tracing driver
Evaluation length	0.2 to 16 mm	0.2 to 16 mm	0.2 to 16 mm	0.2 to 16 mm	0.2 mm to 4.0 mm
Measurement speed	0.5, 0.6, 0.75, 1.0 mm/s	0.5, 0.6, 0.75, 1.0 mm/s	0.5, 0.6, 0.75, 1.0 mm/s	0.5, 0.6, 0.75, 1.0 mm/s	0.6 mm/s
Pickup
Z direction resolution	0.0007 μm/-210 to +160 μm	0.0007 μm/-210 to +160 μm	0.0007 μm/-210 to +160 μm	0.0007 μm/-210 to +160 μm	0.0007 μm/-210 to +160 μm
Measurement force	4 mN	0.75 mN	4 mN	0.75 mN	4 mN
Filter
Cutoff value λc λs	0.08, 0.25, 0.8, 2.5 mm None, 2.5, 8 μm