Sessions

 

Class 1

Time Presentation Company
10:00 AM Incorporated Equipment Under Test (EUT) Monitoring within Immunity Testing ETS Lindgren
11:00 AM EMC/EMI Testing in less than One Second Very-Near-Field Techniques for Far-Field Problems EMSCAN
12:00 PM Using Risk Management to Successfully Identify Essential Performance for Your Device CSA Group
1:00 PM Testing Requirements for Intelligent Electronic Devices in Transmission and Distribution Facilities ARC Technical Resources
2:00 PM Red Directive Nemko

Class 2

Time Presentation Company
10:00 AM AC Hipot Testing Haefely Hipotronics
11:00 AM Leak Rate Test and Measurement Agilent Technologies
1:00 PM Latest Technological Advancements in the Field of Substation Testing Megger
2:00 PM Grid-Connected Test Requirements for UL 1741/IEEE 1547 Preen

 
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Class 1

 
10:00 AM

Incorporated Equipment Under Test (EUT) Monitoring within Immunity Testing

Presented by:

Larry Sheridan, ETS-Lindgren, Cedar Park, Texas
Abstract:

Automating the EMC test process has the benefits of improving measurement accuracy and repeatability while also increasing test throughput. The automated EMC test process is further enhanced by incorporating EUT monitoring using a vision system within the test program. Immunity testing with built-in EUT monitoring decreases error probability. This presentation will show how a vision system can be incorporated into immunity testing and reduced potential errors.
 
11:00 AM

EMC/EMI Testing in less than One Second Very-Near-Field Techniques for Far-Field Problems

Presenter:

Eduardo Lopez, EMSCAN, Watsonville, California
Abstract:

Very-near-field measurements of radiated emissions are fast and easy to make and avoid the delays and set-up needed for far-field measurements in a chamber. They allow EM and RF testing in less than one second! Very-near-field testing of emissions can be done in seconds using a unique array of probes. These very-near-field “emission maps” can be used to identify source of emissions and coupling paths to aid in debugging problems early in the design cycle lowering the risk of compliance issue at the qualification stage.

The emission maps can be even used to predict the EMC chamber results at a board level, reducing the need to go to a chamber during development. The excellent sensitivity and high resolution (0.06mm) of the emission maps is useful in detecting self-interference problems and highlighting root causes down to a pin level

This presentation will show how the distributed array works and discuss using very-near-field measurements to solve emissions problems. Practical tips and a demonstration of an actual “real-time” EMxpert will be shown.
 
12:00 PM

Using Risk Management to successfully identify Essential Performance for your device

Presenter:

Naysahn Saeed, CSA Group, Irvine, California
Abstract:

Based on experience gained from both work done for a medical device manufacturer, and through the process of evaluating and certifying a range of different medical devices on behalf of an independent test house, this presentation describes how risk management can help an organization determine what the potential essential performance of their device may be, and then to further examine the potential essential performance to finally define the true essential performance of the device. With a brief overview of the key concepts of risk management, this presentation should be of use not only to those with extensive risk management knowledge and experience, but also to those with limited or basic understanding of the risk management process as defined by ISO 14971.
 
1:00 PM

Testing Requirements for Intelligent Electronic Devices in Transmission and Distribution Facilities

Presenter:

Jerry Ramie, ARC Tehnical Resource, Inc. San Jose, California
Abstract:

This presentation describes the IEEE standards work undertaken in the last two years on refining the testing requirements for Intelligent Electronic Devices (IEDs)installed in transmission and distribution facilities. The history of IEEE – 1613 pair of Standards for electric utility communications networking equipment and their updating into the next IEEE – 1613 (201x) Standard (covering all IEDs) will be presented. The new P1613 draft harmonizes closely with the IEC requirements for electric utility equipment with some differences. Its expanded Scope includes almost all utility-owned smart grid equipment controls, whether they communicate or not. An overview of the required immunity tests is presented, along with a discussion of the complexities involved with communicating with products during these tests.
 
2:00 PM

Red Directive

Presenter:

Juan Gonzales, Nemko, San Diego, California
Abstract:
 
  • Basic steps from R&YET to Red
  • Articles 3.1(a) / 3.1(b) and 3.2
  • New products under Red
  • Conformity Assessment Procedures
  • RED Challenges
  • Gap Testing and new standards
 

Class 2

 
10:00 AM

AC Hipot Testing

Presenter:

Ken Rousseau, Sr. Associate Sales Engineer, Brewster, New York
Abstract:

AC Hipot Testing as it pertains to bucket truck testing, vacuum bottle testing, and the evolution of testing technology up through present day.
 
11:00 AM

Leak Rate Test and Measurement

Presenter:
Brian Kaemmer, Agilent Technologies, Napa, California
Abstract:
 
  • Introduction to Leak Detection
    • Why leak test?
    • Leak detection operations
    • Understanding leak rate
    • Leak detection methods
  • Leak-Rate Specification Conversion
    • Specification leak rate vs std. cc/sec
    • Specification pressure vs test pressure
    • The Helium leakrate
  • Locating Leaks
    • Spray and sniffer probe techniques
  • Measuring Leak Rate
    • Hard vacuum: Inside-out testing (pressurized part)
    • Hard vacuum: Outside-in testing (evacuated part)
 
1:00 PM

Latest Technological Advancements in the Field of Substation Testing

Presenter:

Dinesh Chhajer, Megger, Dallas, Texas
Abstract:

Substation preventive and predictive maintenance is one of the important task for asset managers and power system operators. In this presentation, substation assets such as transformers, circuit breakers, batteries and current transformers will be discussed. Tests recommended in the international standards, best practices to perform those tests and how to analyze the results will be shared. User attending this presentation will develop a better understanding of how to better maintain their assets and take critical decisions based upon data analysis and results interpretation.

This presentation will also cover latest developments in the offline testing instruments that would help field engineers to obtain data faster, reliably and more accurately without compromising the safety of the operator or the assets. Latest instruments offered by Megger related to those offline tests will be highlighted.
 
2:00 PM

Grid-Connected Test Requirements for UL 1741/IEEE 1547

Presenter:

Brian Hsu (Product Marketing Manager)
Abstract:

The growth of the renewable energy industry, in particular solar and wind, has been explosive over the past decade. With this explosive growth comes challenges. As these power sources become a larger percentage of the grid, utility companies must face a substantial threat to system reliability. These challenges, however, can be met through the coordination of policy, regulation and innovative grid management inverter technology, making renewable energy, and solar PV in particular, an optimum source of power for the future.

The new national standards require the grid inverter in the power generation system must have low voltage ride through (LVRT) and zero voltage ride through functions. The technical requirements for zero voltage ride through is higher than that for low voltage ride through (LVRT) technology compared to technical requirements are higher, and the test for zero voltage ride through is stricter than that for low voltage ride through. Currently, the zero voltage ride through test has become a new standard for measuring domestic inverter technology innovation.
 

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