Radiated Emissions: Near Field Probes

Near field probes detect electrical or magnetic energy in the field directly around a device under test. These probes are commonly used to perform pre-compliance EMC testing on a product in order to detect the presence of electromagnetic interference, or EMI, exceeding relevant regulatory standards.

Two basic varieties of near field probes are E-field probes and H-field probes. E-field probes interact with electric fields generated by voltage changes; the bulbous ending of the probe directly contacts a circuit, tracing the emissions on individual pins or a circuit board. H-field probes are responsive to magnetic fields generated by current changes. The conductive loop on the end of the probe will detect the magnetic field when scanning the component or device. Engineers ensure products achieve EMI compliance by using both probes together to discover the source of EMI.

The newest technology in near field probes are scanners that produce images of the real-time emissions of PCBs without using an external spectrum analyzer. These scanners capture results and display them on your monitor, allowing you to visually inspect and pinpoint issues in seconds.

Industries which require EMC testing for their products, like the defense, aerospace, automotive, medical and communications fields, rely on field probes to ferret out radiated emissions before sending their devices to accredited EMC labs to fulfill IEC-61000, CISPR and MIL-STD standards.

ATEC supplies near-field probe test sets with test frequencies ranging from 9 kHz to 18 GHz. We rent standard probes, laser powered probes, fiber optic transmitters, EMC/EMI diagnostic systems and more. View our inventory below.