MIL-STD-750 defines testing methods for the environmental, physical and electrical testing of semiconductor devices utilized in military and aerospace electronic systems. The methods and procedures throughout the standard cover basic environmental, physical and electrical tests to assess resistance to deleterious effects of natural elements and conditions surrounding military and space operations. For this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices.
The test methods and procedures described in the various parts of this multipart test method standard have been prepared to serve several purposes:
a. To specify suitable conditions obtainable in the laboratory that give test results equivalent to the actual service conditions existing in the field and to obtain reproducibility of the results of tests. The test methods described by this standard are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic location since it is known that the only true test for operation in a specific location is an actual service test at that point.
b. To describe, in a series of standards, all of the test methods of a similar character which now appear in the various joint-services semiconductor device specifications so that these test methods may be kept uniform and thus result in conservation of equipment, man-hours, and testing facilities. In achieving this objective, it is necessary to make each of the general test methods adaptable to a broad range of devices.
c. The test methods described by this standard for environmental, physical, and electrical testing of semiconductor devices shall also apply, when applicable, to parts not covered by an approved military sheet-form standard, specification sheet, or drawing.
Download Standard (Basic Method)
MIL-STD-750F Numbered Part Test Methods
The most recent revision of MIL-STD-750, MIL-STD-750F, has been issued in six parts: the basic test method standard and five numbered parts focused on each section of MIL-STD-750 test methods. The five numbered parts correspond to the following test methods:
|MIL-STD-750 Test Methods Included
|Environmental Test Methods For Semiconductor Devices
|Test Methods 1000 - 1999
|Mechanical Test Methods For Semiconductor Devices
|Test Methods 2001 - 2999
|Electrical Characteristics Tests for Bipolar, MOSFET, and Gallium Arsenide Transistors
|Test Methods 3000 - 3999
|Electrical Characteristics Tests for Diodes, Microwave Diodes, Thyristors, and Tunnel Diodes
|Test Methods 4000 - 4999
|High Reliability Space Application Test Methods For Semiconductor Devices
|Test Methods 5000 - 5999
Products Used in Testing:
EM Test ESD NX30 | 30 kV
The EM Test ESD NX30 electrostatic discharge simulator is an easy-to-use tester. The NX30 consists of a power supply unit and the discharge gun, operated from the discharge gun. The device generates electrostatic discharges up...
Haefely ONYX 30 | 30 kV
The Haefely ONYX 30 kV Electrostatic Discharge (ESD) Simulator is a self-contained ESD gun, eliminating the need for an external base control unit. This device boasts a user-friendly touchscreen for ease of operation, along...
Spectral Dynamics (Dunegan/Endevco) 4511M PIND System
Spectral Dynamics (Dunegan/Endevco) 4511M Particle Impact Noise Detector System is the most advanced PIND system available today. Combining sensors that monitor and display the shaker motion with feedback control to correct for...
inTEST Thermal Solutions
Temptronic TPO4310A Thermal Inducing System
The Temptronic TPO4310A ThermoStream Thermal Inducing System is a temperature-forcing system used to perform device, board, and module testing right where you need it – at your test bench, in your production facility, or...
Teseq NSG 438 ESD Gun | 30 kV
The Teseq NSG 438 30 kV ESD Gun fulfills the requirements of all known ESD standards. The basic model is type approved and calibrated in conformity with IEC 61000-4-2. By adding appropriate network modules, other standards can...