MIL-STD-883 establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. MIL-STD-883 is intended to apply only to microelectronic devices. The test methods, controls, and procedures described in MIL-STD-883 have been prepared to serve several purposes:
a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location. This is because it is known that the only true test for operation in a specific application and location is an actual service test under the same conditions.
b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, many hours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices.
c. To provide for a level of uniformity of physical, electrical and environmental testing; manufacturing controls and workmanship; and materials to ensure consistent quality and reliability among all devices screened in accordance with this standard.
Products Used in Testing:
EM Test ESD NX30 | 30 kV
The EM Test ESD NX30 electrostatic discharge simulator is an easy-to-use tester. The NX30 consists of a power supply unit and the discharge gun, operated from the discharge gun. The device generates electrostatic discharges up...
Haefely ONYX 30 | 30 kV
The Haefely ONYX 30 kV Electrostatic Discharge (ESD) Simulator is a self-contained ESD gun, eliminating the need for an external base control unit. This device boasts a user-friendly touchscreen for ease of operation, along...
Spectral Dynamics (Dunegan/Endevco) 4511M PIND System
Spectral Dynamics (Dunegan/Endevco) 4511M Particle Impact Noise Detector System is the most advanced PIND system available today. Combining sensors that monitor and display the shaker motion with feedback control to correct for...
Teseq NSG 438 ESD Gun | 30 kV
The Teseq NSG 438 30 kV ESD Gun fulfills the requirements of all known ESD standards. The basic model is type approved and calibrated in conformity with IEC 61000-4-2. By adding appropriate network modules, other standards can...