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Image of Teseq NSG 3040A Multifunction Generator, 4.8 kV

Teseq

Teseq NSG 3040A Multifunction Generator, 4.8 kV

The Teseq NSG 3040A Multifunction Generator is a 4.8 kV conducted immunity test solution designed for CE applications. It tests surge voltage to 4.8 kV, EFT/Burst to 4.8 kV / 1 MHz and PQT to 16 A / 300 VAC & DC. The Teseq NSG 3040A simulates electromagnetic interference effects for immunity testing in conformity with international, national, and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040A system is designed to fulfill requirements for CE mark testing, which generally includes combination wave surge, Electrical Fast Transient (EFT) pulses, and Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications.

Product Info
Test Type Specification
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
Pulse voltage (open circuit): ±200 V to 4.8 kV (in 1 V steps)
Pulse current (short circuit): ±100 A to 2.4 kA
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Pulse amplitude: ±200 V to 4.8 kV (in 1 V steps) - open circuit
±100 V to 2.4 kV (50 Ω matching system)
Burst frequency: 100 Hz to 1000 kHz
Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Dips, Interrupts & Variations: From EUT voltage input to 0 V, 0%
Variation test (with VAR 3005A only)
Conforms to IEC/EN 61000-4-11
Uvar with optional variac: up to 265 V up to approx. 265 V (in 1 V steps) or up to 115% Uin (in 1% steps)
Pulsed magnetic field in conjunction with 702A
Conforms to IEC/EN 61000-4-9
Field: 100 to 1200 A/m
Polarity: positive / negative / alternate
Power magnetic field in conjunction with MFT 30 or MFO 6501 and MFC 30 & MFC 300
Conforms to IEC/EN 61000-4-8
Field: 1 to max. 40 A/m (in 1 A/m steps)
Frequency: 50/60 Hz
  • One box solution system 
  • Surge voltage to 4.8 kV
  • EFT/Burst to 4.8 kV / 1 MHz
  • PQT to 16 A / 300 VAC & DC
  • Easy to use 7“ color touch screen
  • Parameters can be changed while test is running
  • Wide range of optional test accessories
  • EMC Directives
  • UN ECE R10 (Automotive)
  • IEC/EN 61000-4-4
  • IEC/EN 61000-4-5
  • IEC/EN 61000-4-8
  • IEC/EN 61000-4-9
  • IEC/EN 61000-4-11
  • IEC/EN 61000-4-29
  • ANSI/IEEE C62.41
  • EN 61000-6-1
  • EN 61000-6-2
  • EN 50370
  • EN 61643
  • EN 300386-2
  • EN 300386 V1.3.2
  • EN 301489-1
  • EN 301489-7
  • EN 301489-17
  • EN 301489-24
  • IEC 60255-1
  • IEC 60601-1-2
  • IEC 61326
  • IEC 61850-3
  • ITU-T K.12
  • ITU-T K.20
  • ITU-T K.21
  • ITU-T K.28
  • ITU-T K.41
  • ITU-T K.44
  • ITU-T K.45


SKU: TESE-NSG3040A