The fast measurement speed and modular nature of the E5260A makes it an ideal choice for high-speed production test. For technologically advanced devices of today and tomorrow, the Keysight E5260A lowers your cost-of-test with a high-speed parametric test solution for semiconductor, RFIC, and optical component testing.
Based on well-proven Keysight 4070 Series system technology, the E5260A provides superior measurement throughput that is several times faster than earlier products such as the Keysight 4142B. The instrument is modular, which enables customization now and provides for future expansion as requirements change.
A number of innovative design elements help to improve the efficiency of complex testing, such as expanded program memory to accelerate the measurement process, and 16 digital I/O lines for sophisticated triggering requirements. Moreover, historically encountered power limitations on the instrument mainframe (such as often occur with the 4142B) have been eliminated.