Keithley 4200-SCS Semiconductor Characterization System

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The Keithley 4200-SCS Semiconductor Characterization System is an ideal parameter analyzer for the electrical characterization of devices, materials, and semiconductor processes. The device can conduct tests, including very low-level DC measurements, C-V, and ultra-fast I-V for pulse and transient tests. The Keithley 4200-SCS has 2 independent voltage sources that can slew the voltage at 1V/ns while simultaneously measuring both the voltage and the current. When multiple modules are installed, they are internally synchronized to less than 3 ns.

The Keithley 4200-SCS Semiconductor Characterization System provides intuitive and sophisticated capabilities for semiconductor device characterization with 9 slot chassis and an integrated controller. By combining unprecedented measurement sensitivity and accuracy, the device ensures measurement accuracy of 0.015% +3 mV at 200 V and 0.012% +80 µV at 200 mV. 

The Keithley 4200-SCS Semiconductor Characterization System is equipped with an embedded Windows®-based operating system while featuring an integrated DVD/CD-RW drive, allowing high-capacity backup and data transfer. The Keithley 4200-SCS is modular, configurable, and upgradeable, offering four core measurement modules to be mixed and matched in the nine instrument slots and configured with up to seven additional SMUs.