Keithley 4200-SCS Semiconductor Characterization System

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The Keithley 4200-SCS Semiconductor Characterization System is a total system solution for electrical characterization of devices, materials and semiconductor processes. This advanced parameter analyzer provides intuitive and sophisticated capabilities for semiconductor device characterization by combining unprecedented measurement sensitivity and accuracy with an embedded Windows®-based operating system and the Keithley Interactive Test Environment. It is a powerful single box solution.The 4200-SCS is modular, configurable and upgradeable. This allows it to precisely meet today's measurement needs and to expand to meet tomorrow's. Four core measurement modules can be mixed and matched in the nine instrument slots.