Hitachi X-Strata920 Benchtop System W/ SDD

The Hitachi X-Strata920 Benchtop System allows for precise and in-depth coatings analysis. The X-Strata920 has a high resolution silicon drift detector (SDD), multiple language options, and user-friendly software. Able to analyze single-layer and multi-layered coatings, the X-Strata920 is the ideal model for a variety of testing requirements.

Product Info Related Products

Dimensions (without PC and monitor: W x L x H)	Standard base: 407 x 770 x 305 mm (16 x 30.3 x 12") Wide standard base: 610 x 1037 x 305 mm (24 x 40.8 x 12”) Mini-well base: 407 x 770 x 400 mm (16 x 30.3 x 15.7") XY motorised base: 610 x 1037 x 375 mm (24 x 40.8 x 14.8")
Weight (without PC and monitor)	97 kg
Element range	Aluminium¹³ to Uranium⁹²
Number of layers and elements	4 layers + base Composition analysis of up to 25 elements simultaneously
X-ray excitation	50 W (50 kV and 1.0 mA) micro-focused tungsten anode tube
X-ray detector	High resolution silicon drift detector (SDD)
Working environment	10°C (50°F) to 40°C (104°F) and up to 98% relative humidity, non-condensing
Power supply	85 - 130 or 215 - 265 volts, with frequency range of 47 Hz to 63 Hz
Configurations	Standard base (for parts up to 16 mm / 0.63" in height) Wide standard base (for parts to 16 mm / 0.63" in height) Fixed table size: 560 x 610 mm (22” x 24”) Mini-well base (for parts up to 143 mm / 5.6" in height) XY programmable table Table travel: 178 mm x 178 mm (7" x 7") Z travel on all configurations: 19 mm (0.75") Slotted chamber on all configurations