Com-Power PS-500 Near Field Probe Set for EMI/EMC Testing

In addition to the probes included in the PS-400 probe set, the PS-500 Com-Power PS-500 Near Field Probe Set for EMI/EMC Testing includes a probe with a fine metal tip that allows contact with the circuit being probed to measure levels directly on the trace. The H-Field Loop probe allows detection of magnetic noise emanating from chassis seams, ribbon cables and connector pins. Using the probes, the test engineer can quickly find and suppress the EMI at the source, before resorting to other means of EMI suppression. The probe set can be used with the optional Com-Power PAP-501 RF Preamplifier with 20 dB nominal gain from 10 MHz to 1000 MHz.

Product Info Related Products

Probe	Loop	Broadband	Fine Tip	Contact Tip
Frequency (MHz)	0.3-100	20 -1000	30-600	300-1500
Type	H-field	E-field	E-field	E-field
Connector	BNC (f)	BNC (f)	BNC (f)	BNC (f)
Dielectric breakdown	1 kV	1 kV	1 kV	1 kV
DC input at the tip	N/A	N/A	N/A	50 VDC
Weight	4 oz	4 oz	4 oz	4 oz