Taylor Hobson Talysurf Surface Roughness Tester i-Series

Taylor Hobson Surface Roughness Tester i-Series Surface Roughness Testers are high-range, high-resolution surface roughness test systems for contour and surface finish measurement. The Taylor Hobson Talysurf Surface Roughness Tester i-series is a high accuracy instrument range capable of simultaneous surface finish and contour measurement. The system's low noise axes and high-resolution gauge ensure measurement integrity with choice of gauge ranges providing versatility for a variety of applications. From screw threads to crankshafts or engine blocks to valve guides, select the configuration that suits your requirements.

The Ametek Taylor Hobson Surface Roughness Tester i-Series is available in 1 mm, 2 mm and 5 mm gauge range with a traverse length of up to 200 mm. Standard across all i-Series models, this unique system monitor feeds back changes in ambient temperature, ensuring consistent system performance and high measurement integrity, regardless of environmental effect.

Products in the Taylor Hobson i-Series include the iSeries-Pro Range Surface Roughness Tester.

Product Info Related Products

Surface Finish Parameters
Primary parameters	DFTF, LSLP Ave, LSLP Max, Pa, Pc, PCf, PCl, PCr, Pda, Pdc, Pdq, PHSC, Pku, Pln, PLo, Plq, Pmr, Pmr(C), Pp, PPc, Pq, PS, Psk, PSm, Pt, Pv, PVo, Pz, Pz(JIS)
Roughness parameters	R3y, R3z, Ra, Rc, RCf, RCl, RCr, Rda, Rdc, Rdq, RHSC, Rku, Rln, RLo, Rlq, Rmr, Rmr(C), Rp, Rp1max, Rpc, Rq, RS, Rsk, RSm, Rt, Rv, Rv1max, RVo, Rz, Rz(DIN), Rz(JIS), Rz(n), Rz1max
Waviness parameters	Wa, Wc, WCf, WCl, WCr, Wda, Wdc, Wdq, WHSC, Wku, Wln, WLo, Wlq, Wmr, Wmr(C), Wp, WPc, Wq, WS, Wsk, WSm, Wt, Wv, WVo, Wz
Rk paramters and Rk curve	A1, A2, APH, AVH, CV, Mr1, Mr2, Rk, Rpk, Rvk, Rvk/Rk
R & W parameters	AR, AW, Pt, R, Rke, Rn, Rpke, Rvke, Rx, Sar, Saw, Sr, Sw, W, Wn, Wte, Wx
Dominant wavelength	WD1c, WD1Sm, WD1t, WD2c, WD2Sm, WD2t, WDSmMax, WDSmMin
System Performance
Calibration Pt	< 0.25 µm (10 µin)
System noise - Rq	< 6 nm (0.24 µin)
Radius measurement uncertainty	0.1 - 22mm (0.004 - 0.87in) - 1% to 0.015% of nominal 22 - 1000mm (0.87 - 39.4in) - 0.015% to 0.1% of nominal
Inclination measurement uncertainty	0.5 arc minute (±35° Maximum Range)
Horizontal Performance
Traverse length – X max / min	60 mm / 0.1 mm (2.4 in / 0.004 in) 120 mm / 0.1 mm (4.7 in / 0.004 in) 200 mm / 0.1 mm (7.9 in / 0.004 in)
Traverse speeds	13 mm/s (0.51 in/s) max
Measuring speed	0.25 mm/s, 0.5 mm/s, 1 mm/s & 2 mm/s (0.01 in/s, 0.02 in/s, 0.04 in/s & 0.08 in/s)
Minimum data sampling interval in X	0.125 µm (5 µin)
Straightness accuracy (Pt)	0.15 µm (5.9 µin) 0.18 µm (7.1 µin)
X axis indication accuracy	(1 + 0.02 L) µm
Vertical Performance
Nominal measuring range (Z)	1 mm Gauge Range	2 mm Gauge Range	5 mm Gauge Range
Range 1	1 mm (0.04 in)	2 mm (0.08 in)	5 mm (0.20 in)
Range 2	0.2 mm (0.008 in)	1 mm (0.04 in)	2.5 mm (0.10 in)
Range 3	0.04 mm (0.002 in)	0.2 mm (0.008 in)	0.5 mm (0.02 in)
Range 4	Not applicable	0.04 mm (0.002 in)	0.1 mm (0.004 in)
Resolution (Z)
Range 1	4 nm (0.16 µin)	8 nm (0.32 µin)	20 nm (0.79 µin)
Range 2	0.8 nm (0.03 µin)	4 nm (0.16 µin)	10 nm (0.39 µin)
Range 3	0.16 nm (0.006 µin)	0.8 nm (0.03 µin)	2 nm (0.079 µin)
Range 4	Not applicable	0.16 nm (0.006 µin)	0.4 nm (0.016 µin)
Range to resolution	262144 : 1
Stylus arm length, tip size, force	60 mm stylus 2 µm radius conisphere diamond, 1mN Force	120 mm stylus 2 µm radius conisphere diamond, 1mN Force
Z axis non-linearity (Z = gauge displacement)	Resolution + (0.05 Z[mm])µm (Resolution + (50 Z[inches])µin) after calibration
Repeatability of Z axis indication	Repeatability of Z axis indication Curved Surface 0.05um (2.0uin)1	Flat Surface 0.10um (3.9uin) Curved Surface 0.10um (3.9uin)1