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Taylor Hobson Surtronic S-100 Series Surface Roughness Tester
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Column Stand for S100 Series Surface Roughness Testers
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The Taylor Hobson Surtronic S-100 Series Surface Roughness Tester comes in two models: S-116 and S-128. Both models in this series are durable instruments designed for shop floor, industrial, and inspection room applications. The Taylor Hobson Surtronic S-100 offers a versatile solution for all roughness requirements with a variety of systems and application specific accessories that can be tailored for your testing needs. The inclusion of a 50 mm stylus lift with right angle attachment and more than 70 mm stylus reach means that even the most challenging surfaces can be measured without the need for expensive riser blocks, stands or fixtures.
The Taylor Hobson Surtronic S-100's design covers comfort, functionality, precision, and quality. Through its industry standard type A USB port as well as its mini USB port, allowing for easy connection to printers and other devices. Easy set-up with an arsenal of shortcuts assures the minimum amount of time needed to conduct accurate and effective tests. Both S-116 and S-128 models support a dozen languages including English, French, Spanish, and Russian. Where they most differ is range, resolution, noise floor, and repeatability.
The Taylor Hobson Surtronic S-100 Series Surface Roughness Tester includes to models: the S-116 and
S-128
.
Specifications
Features
Applications
Options
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Standards
Videos
Features
Tactile measurement button, great when device is being used overhead or inside pipes
Standard lift/lower function providing 50 mm height adjustment, right angle measurement and 70 mm reach into bores
Anti-slip feet, perfect for mounting on flat or curved surfaces
Comfort grip sits in the hand when reviewing or changing settings
Rubberized molding for added protection and better grip in the hand invaluable in shop floor environments
USB type A connectivity, attachable to portable printers
Specifications
Gauge
S-116
S-128
Range
200 µm / 100 µm / 10 µm
400 µm / 100 µm / 10 µm
Resolution
100 nm / 20 nm / 10 nm
50 nm / 10 nm / 5 nm
Noise floor (Ra)
250 nm / 150 nm / 100 nm
150 nm / 100 nm / 50 nm
Repeatability (Ra)
1% of value + noise
0.5% of value + noise
Pickup type
Inductive
Gauge force
150-300 mg
Stylus tip radius
5 µm (200 µin) default / 2 µm (80 µin) or 10 µm (400 µin) optional
Measurement type
Skidded
Analysis
Filter cut-off
0.25 mm / 0.8 mm / 2.5 mm
Filter type
2CR / Gaussian
Evaluation length
0.25 - 17.5 mm (0.01 - 0.70 in)
0.25 - 25.0 mm (0.01 - 1.00 in)
Max X axis range
17.5 mm
25.5 mm
Speed
Measuring
1 mm / sec (0.04 in / sec)
Returning
1.5 mm / sec (0.06 in / sec)
Applications
Options
Accessories
Standards
Media
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