IEC 61000-4-20 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type.
The object of this standard is to describe:
- TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations;
- TEM waveguide validation methods for EMC measurements;
- The EUT (i.e. EUT cabinet and cabling) definition;
- Test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and
- Test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.
Test methods are defined in this standard for measuring the effects of electromagnetic radiation on equipment and the electromagnetic emissions from equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate repeatability of results at various test facilities for qualitative analysis of effects.
This standard does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. These other distinct test methods may be used when so specified by product committees, in consultation with CISPR and TC 77.
Retrieved from IHS on 7-3-2009