IEC 61000-4-29 Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement...

This subsection of IEC 61000 defines test methods for immunity to voltage dips, short interruptions and voltage variations at the DC input power port of electrical or electronic equipment. This test is similar to the IEC 61000-4-11 dips/interrupt test but applies to DC-powered products.

IEC 61000-4-29 applies to low voltage DC power ports of equipment supplied by external DC networks.

The object of IEC 61000-4-29 is to establish a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on DC input power ports.

IEC 61000-4-29 defines:
- The range of test levels
- The test generator
- The test set-up
- The test procedure

The test applies to electrical and electronic equipment and systems. It also applies to modules or subsystems whenever the EUT (equipment under test) rated power is greater than the test generator capacity specified in clause 6.

The ripple at the DC input power port is not included in the scope of this part of IEC 61000. It is covered by IEC 61000-4-17.

Common features for all IEC 61000-4 standards

• Pre-set test sequences and test levels
• Immunity tests can be run continuously or in single-step mode to allow close observation of EUT performance.
• Measurements such as voltage and current and recorded at each test step and included in test reports.
• User-guided prompts the operator through the entire test procedure.
• All test sequences are fully customizable by the user if needed to create a custom version or special purpose test variations as desired.

This standard does not specify the tests to be applied to a particular apparatus or system. Its main aim is to give a general basic reference to IEC product committees. These product committees (or users and manufacturers of equipment) remain responsible for the appropriate choice of the tests and the severity level to be applied to their equipment.