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The Vitrek V79 4 Wire 30A Ground Bond Tester is part of the V7X Series of high performance, low cost hipot testers. With color touch LCD & high speed DSP technology, the compact and rugged V7X sets the standard for price/performance ratio. Made in the USA to meet tough UL, TUV and IEC requirements - the V7X provides unbeatable speed, accuracy, safety and reliability.
Features
- Easy to Use
- 4.3" High Resolution Color Touch Display - Intuitive Graphical User Interface
- Large High Reliability START and STOP switches
- Large easy to see PASS/FAIL Indicators
- Easy to Own
- Low Cost of Ownership - 2 Year Calibration Interval, 2 Year Parts & Labor Warranty
- In-Field Updating of Firmware
- Compact and Lightweight
- Only consumes 5W when not testing
- High Quality
- Made in the USA - Designed & Built in San Diego CA
- Reliable
- Rugged Construction
- Fan free, vent free Design
- High Efficiency Switch-Mode Drive with low temperature rise
- Full Function
- Fast (100ms min test time) and Accurate (1%)
- 5 Functions - AC/DC Hipot, Insulation Resistance, Ground Bond & Low Resistance
- 5KV AC/DC Hipot, 20mA max source current, 100nA Leakage Current Resolution
- Continuously Variable Insulation Resistance 20-5000V up to 450GΩ
- Ground Bond 1-30A RMS, 100µΩ Resolution
- Wide range (0 to 60KΩ) low resistance measurements with 1mΩ resolution
- Ramped Discharge Capability
- Selectable ARC Detection
- Multi-Mode IR with Steady or Rising Pass Mode
- Able to test either grounded or non-grounded DUTs
- Wide range of capacitive loads can be tested (up to several µF)
- Built-In Verification
- Completely Internal Self-Test Fully Exercises Output and Verifies Current Accuracy
- Pre-Programmed Daily Verification Test With Optional PVD Test Load
- Safe
- 150µs Safety Shutdown
- Automatic DUT Discharge
- Meets UL, CSA, IEC Safety Tester Requirements
- CE Safety Mark Certified to EN61010
- Equally at home in simple and complex systems
- USB 2.0, Serial RS232 and Digital I/O Interfaces are Standard
- Able to be used in Complex Multi-Point Scanning Systems
- Test Memory Stores up to 999 Steps and 60 Test Sequences which can be named by the user
- Test steps for on-screen prompted user actions
- On-screen review of complete test results for every test step
Specifications
| Low Resistance |
| Resistance | Range: 0ohm to 60Kohm |
| | Accuracy : 1.4 %+0.02Ω (<10Ω), 3%+1ohm (<1KΩ), 10% above 1KΩ Resolution : Down to 0.001Ω |
| | Min/Max Limits : Defined for each step, each may be set to none |
| Test Method | 2 terminal measurement , 10.5mA max, 4.15V max |
| Resistance Offset | Test leads/fixture measurement offset may be universally applied |
| Ground Bond |
| Test Current | 1 to 30Arms (42A pk), 50/60Hz |
| | Accuracy : 2.5%+10mA |
| | Resolution : settable to 0.01A at all levels |
| | Compliance: > 4.5Vrms (6V pk) for all currents |
| Method | 4 terminal measurement |
| Resistance | Max Resistance: Up to compliance V limit at defined test current (4.5ohms max) |
| | Min/Max Limits : Defined for each step, min may be set to none |
| | Accuracy : 2.5%+3mΩ (<2A), 2mΩ (<6.5A), 1mΩ (otherwise) Resolution : 0.1mΩ (>6.5A), 1mΩ (otherwise) |
| Resistance Offset | Test leads/fixture measurement offset may be universally applied |
| Test Timing |
| Test/Dwell | Time 0.1 to 9999sec or user end (0.1sec resolution, 0.15sec accuracy) |
| Ramp Down | May be set to 0sec or same as Ramp time, automatically skipped if no failure and next step is same AC/DC or IR test type |
| Shutdown | Breakdown : within 150us |
| | HV Safety : within 1ms |
| | User Stop or Interlock opened : within 2ms |
| | Resistance/Current Limit : within 100ms |