Teseq NSG 3040 Transient Generator

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The Teseq NSG 3040 Transient Generator generates surge voltage to 4.4 kV and emits an EFT/Burst pulse of up to 4.8 kV/1 MHz. Teseq NSG 3040 devices simulate electromagnetc interference effects for the purpose of immunity testing in compliance with manufacturer, national and international standards. Technicians can utilize this product in assignments calling for IEC 61000-4-4, IEC 61000-4-5, IEC 61000-4-8, IEC 61000-4-9, and IEC 61000-4-11 standard-compliant devices. The "Master-Slave" architecture of the units allow individual pulse modules to be calibrated separately; calibration data and correction factors can be stored on the slave controller. Teseq NSG 3040 systems are designed to fulfill EMC test requirements for CE mark testing, including combination wave surge, Power Quality Testing (PQT) and Electrical Fast Transient (EFT) pulses. The 7.2" color TFT display featurs a touchscreen interface, a wheel with step size keys and large, start-stop-pause keys.