Voltage dips and interrupts occur when a device or electrical system experiences a sudden load change, such as a short circuit or network fault. A dip/interrupt waveform simulates these conditions. Successive dips or interrupts lead to electrical inefficiency and power failures, and so test engineers rely on transient generators, which mimic the dips and interrupts a device may encounter in the field to the specifications of conducted immunity EMC test standards. Transient generators demonstrate electrical qualities like peak inrush current, transition times and durations.
A voltage dip, brief interruption or otherwise sizable variation in voltage is generally caused by factors like network faults, installation problems or dramatic load changes. Variations in voltage often are a response to load changes. Interrupts and dips are no exception and may even occur consecutively depending on the unique qualities of the loads connected to the network and the origin of the transient.
Voltage Dips and Interrupts Test Standards