Skip to Content

Particle Impact Noise Detection (PIND)

A PIND (or Particle Impact Noise Detection) tester is a non-destructive method of detecting loose particles within an electronics device cavity that may cause short circuits or other malfunctions. This device operates by vibrating and mechanically shocking the testing sample to cause any loose particles within the device to move about the cavity. If loose particles are present, their impact is registered by the ultrasonic transducer of the tester.

ATEC carries PIND testers from leading manufacturers such as B&W and Spectral Dynamics. Our company meets and exceeds the necessary military standards associated with this device (U.S. MIL-STD-883, 750, 202, 39016D).