TTC LDA2000 DS1 and DS0 Circuits Tester
Perform bit error rate testing on in-service DS1 and DS0 circuits, regardless of framing or line code, without disrupting the live traffic.
- Patented Live Data Analysis (LDA) technology performs bit error rate testing on live traffic
- Test T1, Fractional T1, DS0 circuits for bit errors from non-intrusive T1 access points
- Troubleshoot intermittent, time-specific, and data-dependent problems with time-stamped results
- Sectionalize a problem to minimize circuit downtime
SKU: TTC-LDA2000