Associated Research 7564SA Quadchek II AC/DC Hipot

The Associated Research 7564SA Quadchek II AC/DC Hipot performs the duties of an insulation resistance & ground bond tester. It has a voltage of 115/230V AV ± 15%, 1Ø and a frequency range of 47 - 63Hz. Additionally, this device also has a fuse with a 6.3A, 250V slo-blo.

Product Info Related Products

Voltage	115/230 V AV ±15%, 1Ø, user selectable
Frequency	47 Hz - 63 Hz
Fuse	6.3 Amp 250 V Slo-Blo
Dielectric Withstand Test Mode
Output Rating	5 kVAC @ 40 mA, 6 kV DC @ 10 mA
Ramp Hi(DC)	Range: 12 mA peak max., ON/OFF selectable
Charge Lo (DC)	Range: 0.0 - 350 μA or auto set
Hi-Limit (AC)	Range:	0.00 - 40.00 mA
	Resolution:	0.01 mA/steps
	Accuracy:	±(2% of setting 2 counts)
DC Output Ripple	≤4% Ripple RMS at 6 kV DC @ 3.5 mA, Resistive Load
AC Output Wave Form	Sine Wave, Crest Factor = 1.3 - 1.5
Output Frequency	Range:	60 or 50 Hz, User Selectable
	Accuracy:	±1%
Output Regulation	±(1% of setting + 5 volts) from no load to full load
Insulation Resistance Test Mode
Output Voltage	Range:	100 VDC - 1000 VDC
	Resolution:	1 volt/steps
	Accuracy:	±(2% of setting + 2 volts)
Short Circuit Current	Max.: 12 mA peak
Charge Lo	Range: 0.000 - 3.500 μA or Auto Set
Hi-Limit	Range: 0 - 9999 MΩ (0 = Off)
Lo-Limit	Range: 1 - 9999 MΩ
Ground Bond Test Mode
Output Voltage (Open Circuit Limit)	Range:	3.00 - 8.00 VAC
	Resolution:	0.01 volt/steps
	Accuracy:	+ (2% of Setting + 0.03 V)
Output Frequency	Range:	60 or 50 Hz, User Selectable
	Accuracy:	±1%
Output Current	Range:	3.00 - 30.00 Amps
	Resolution:	0.01 volt/steps
	Accuracy:	±(2% of setting + 0.02 A)
Hi/Lo Limit	Range: 0-600 mΩ for 3-10 A; 0-150 mΩ for 3-30 A Resolution: 1 mΩ/steps Accuracy: + (2% of Setting + 2 mΩ)
Milliohm Offset	Max. Offset Capability: 200 mΩ Resolution: 1 mΩ/steps Accuracy: + (2% of Setting + 2 mΩ)

GPIB (IEEE-488), RS-232 or Printer Interfaces
Available in 500 VA Output Versions
Optional Built-In & External Scanner Capabilities
Output of all Test Data can be Viewed Through a Single LCD Display
Interconnects to the RUNCHEK. Functional Run Test System or the LINECHEK. Line Leakage Tester to Form a Complete Test System
Patented RAMP HI/CHARGE LO Circuit for Efficient DC Testing
Perform all Tests Through a Single DUT (Device Under Test) Connection
Designed to Meet Safety Agency Standards such as UL, CSA, IEC, VDE, ToV and the European Norms including the Low Voltage Directive 73/23/EEC

SKU: ASSO-7564SA