| Test Set |
| E5071C-280 |
2-port Test Set, 9 kHz to 8.5 GHz without Bias Tees |
| E5071C-285 |
2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees |
| E5071C-480 |
4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees |
| E5071C-485 |
4-port Test Set, 100 kHz to 8.5 GHz with Bias Tees |
| E5071C-240 |
2-port Test Set, 9 kHz to 4.5 GHz without Bias Tees |
| E5071C-245 |
2-port Test Set, 100 kHz to 4.5 GHz with Bias Tees |
| E5071C-2K5 |
2-port Test Set, 300 kHz to 20 GHz with Bias Tees |
| E5071C-440 |
4-port Test Set, 9 kHz to 4.5 GHz without Bias Tees |
| E5071C-4K5 |
4-port Test Set, 300 kHz to 20 GHz with Bias Tees |
| E5071C-445 |
4-port Test Set, 100 kHz to 4.5 GHz with Bias Tees |
| E5071C-4D5 |
4-port Test Set, 300 kHz to 14 GHz with Bias Tees |
| E5071C-465 |
4-port Test Set, 100 kHz to 6.5 GHz with Bias Tees |
| E5071C-460 |
4-port Test Set, 9 kHz to 6.5 GHz without Bias Tees |
| E5071C-2D5 |
2-port Test Set, 300 kHz to 14 GHz with Bias Tees |
| E5071C-265 |
2-port Test Set, 100 kHz to 6.5 GHz with Bias Tees |
| E5071C-260 |
2-port Test Set, 9 kHz to 6.5 GHz without Bias Tees |
| Additional Software Options |
| E5071C-010 |
- Time Domain Analysis Software
- Fully error-corrected time domain reflection or transmission response
- Up to 20,001 point measurement with low-pass or band-pass mode selection
- Gating available to remove unwanted responses
|
| E5071C-790 |
- Measurement Wizard Assistant (MWA) Software
- Available for the E5071C and the E5091A/E5092A configurable multiport test set
- For simplifying multiport device measurements
- Easy and fast measurement setup with step-by-step setup wizard
- Measurement connectivity matrix with the multiport test set
- Minimized operating time with calibration wizard
- Automatic text procedure with go/not go limit test
|
| E5071C-008 |
- Frequency Offset Mode Software
- Transmission response measurement of devices such as mixers and converters
- Frequency-offset sweep
- Scalar Mixer Calibration (SMC) for accurate conversion loss/gain measurements
- Vector Mixer Calibration (VMC) for phase and group delay measurements
|
| E5071C-TDR |
- Enhanced Time Domain Analysis Software
- Real time measurements simultaneously in time domain (TDR/TDT) and frequency domain (S-parameters)
- Eye diagram tests without external bit pattern generator
- Stressed eye diagram analysis
- Impedance analysis
- ESD Robustness
|
| Timebase Stability |
| E5071C-UNQ |
Standard stability timebase |
| E5071C-1E5 |
High stability timebase |
| Hard Disk Drive Options |
| E5071C-017 |
Removable Data Storage |
| E5071C-019 |
Standard Data Storage |
| |