Tektronix BSX-BERTScope Series Bit Error Rate Testers (BERT)

The Tektronix BSX-BertScope series includes interactive link training at data rates up to 32 Gb/s. With the addition of powerful data processing and internal Tx equalization, the Tektronix BSX-BERTScope series supports protocol-based handshaking and synchronization with a device under test (DUT). The Tektronix BSX-BERTScope series Bit Error Rate Tester introduces a receiver test platform capable of supporting emerging 4^th-generation standards and beyond. The BSX-BERTScope series shortens the time to debug the physical layer and link training issues. Additionally, this series of BER testers provides the quickest path to compliance for a broad range of industry standards.

The BSX-BERTScope series memory sequencer implements flexible, indirect access to pattern memory. The pattern memory can support two levels of loop nesting with up to 1 million iterations per loop. To further simplify programming and increase memory efficiency, individual pattern segments can be any size greater than 128 bits. Advancement of the memory sequence can be controlled by software control, external signal, or detector pattern match -- this provides the user with multiple means of controlling handshaking with their test devices.

The Tektronix BSX-BERTScope series contains the following models: the BSX125, the BSX240, and the BSX320.

Product Info Related Products

	BSX125	BSX240	BSX320
Frequency range	0.6 to 12.5 Gb/s	1 to 24 Gb/s	1 to 32 Gb/s
Connector	3.5 mm	3.5 mm	3.5 mm
Impedance	50 Ω	50 Ω	50 Ω
Threshold voltage	–2 to +3.5 V	–2 to +3.5 V	–2 to +3.5 V
Threshold presets	LVPECL, LVDS, LVTTL, CML, ECL, SCFL	LVPECL, LVDS, LVTTL, CML, ECL, SCFL	LVPECL, LVDS, LVTTL, CML, ECL, SCFL
Terminations	Variable: –2 V to +3 V Presets: +1.5, +1.3, +1, 0, –2 V, AC coupled	Variable: –2 V to +3 V Presets: +1.5, +1.3, +1, 0, –2 V, AC coupled	Variable: –2 V to +3 V Presets: +1.5, +1.3, +1, 0, –2 V, AC coupled

Provides a single solution for receiver stress testing, debugging, and compliance.
Test Gen-3 and Gen-4 standards including PCIe, SAS, and USB 3.1 and proprietary standards.
DUT handshaking capability above 16 Gb/s supporting RX test requirements for loopback initiation and adaptive link training for key standards such as PCIe.
Protocol-aware pattern generation and error detection supports flexible stimulus response programmability and debugging of handshaking issues.
Forward error correction (FEC) emulation option supports measurement of BER both before and after error correction for commonly used Reed-Solomon FEC codes.
Calibration and test automation software available for key standards.

Design verification including signal integrity, jitter, and timing analysis.
Design characterization for high-speed, sophisticated designs.
Design/Verification of high-speed I/O components and systems including DUT handshaking.

SKU: TEKT-BSX-SERIES