Sessions


 

Track 1

Time Topic Presenter
9:00 AM EMC 101: What is EMC Testing & Why It Is Important Chuck Britten
10:00 AM Bench and Lab Testing 5G and IoT Enabled Devices: Where did all the Lab Space Go? James Young
11:00 AM Understanding AC Power Sources Brian Hsu
1:00 PM High Power Solid State Advances in Technology Paulo Correa
2:00 PM New Advancements in 4-Quadrant Power and Challenges in Functional Testing Robert Hanson
3:00 PM Today’s Modern FFT-Based Receiver Technology: Providing Solutions for Full-compliant EMC Testing and Real-time Spectrum Analysis Stephan Braun & Gene Taylor

Track 2

Time Topic Presenter
9:00 AM Understanding Electrical Safety Testers Chad Clark
10:00 AM Reliable Distance Protection Based on Measured Line Parameters & Comprehensive Ground Testing Moritz Pikisch
11:00 AM How the Automotive Market is Evolving Brett Leavitt
1:00 PM Field Test Procedures for Determining Pressure Levels of Vacuum Interrupters Finley Ledbetter
2:00 PM Leak Rate Test and Measurement Lou Harrell
3:00 PM Latest Technological Advancements in the Field of Substation Testing Larissa Sargent
 
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9:00 AM

EMC 101: What is EMC Testing & Why It Is Important

Presented by: Chuck Britten, AR RF/Microwave Instruments
Abstract:
The importance of EMC testing and using in-house vs outside labs. Overview of Standards and what equipment is needed. Sign up
 
10:00 AM

Bench and Lab Testing 5G and IoT Enabled Devices: Where did all the Lab Space Go?

Presented by: James Young, ETS Lindgren
Abstract:
If you haven’t been asked if adding some sort of wireless interface is possible for one of your company’s products, just wait. Wireless enabled products are now so common that it is considered for even the most mundane items. The predictions are for wireless to reach literally any product as Internet of Things (IoT) and Gbps 5G mobile devices seek killer app status. So regardless of your area of engineering expertise, wireless is likely to become a topic of discussion, if not so currently.  This session will cover why 5G and IoT devices will require significant changes to the lab, outline available solutions, and provide basic facts targeted toward software, hardware and EMC engineers. RF engineers are welcome to chime in as well. Sign up
 
11:00 AM

Understanding AC Power Sources

Presented by: Brian Hsu, Preen
Abstract:
Many industrial and commercial applications in factory, research labs, UPS and military need AC power sources with programmable voltage and frequencies. In some cases, up to 2000KVA and 400Hz are needed. Depends on the applications, there are different design requirements and challenges. Therefore, it is important to understand the differences and trade-offs between the dynamic and static design as wells as the pros and cons of using transformer vs. transformerless power sources. Sign up
 
1:00 PM

High Power Solid State Advances in Technology

Presented by: Paulo Correa, Empower
Abstract:
Advances in semiconductor RF device technology are widely communicated and well known within our EW community. What’s not widely known is how the latest developments in high speed programmable cores, ADC’s / DAC’s, DSP, fiber optics, and electro mechanical devices can be utilized in the architecture of high power solid state transmitter in ways that significantly advance the state of the art for mission critical high power systems.

In this technical session Paulo Correa will describe the variety of latest technology developments and when implemented together they create solid state alternatives for higher power, higher frequency transmitters. Topics covered include:

• S-band / C-band / X-band illustrations and algorithms for DSP high performance  HPA’s
     - Feedback loops, digital error correction
     - Fiber optic Gigabit inside the rack
     - Advancement in low loss combining
• Insights into the architecture for eliminating single points of failure
     - Inherent redundancy and never “off air”
• Hot swapping technology and method described
     - Maximizing uptime
     - Field service support
• Analysis of MTTF
     - Cost of operating
     - Availability of service
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2:00 PM

New Advancements in 4-Quadrant Power and Challenges in Functional Testing

Presented by: Robert Hanson, NH Research
Abstract:

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3:00 PM

Today’s Modern FFT-Based Receiver Technology: Providing Solutions for Full-compliant EMC Testing and Real-time Spectrum Analysis

Presented by: Gene Taylor, Caprock Technical Services, Inc. & Stephan Braun
Abstract:
Taking reliable, repeatable, broad-spectrum measurements are frustrated in three areas - computational limits, narrow band focus and unpredictable transients. All three problems can be easily identified and solved with new capabilities in today’s modern FFT-based receiver technology. This presentation will show how parallel processing and FFT-enabled signal measurement path can offer a ‘Single glance’, ‘wide Field-Of-View’ solution for all full-compliant EMC testing and real-time spectrum analysis and debugging. This simplifies, speeds up by orders of magnitude and increases the overall measurement quality and reliability as well as the productivity in your lab all at the same time. Sign up
 
9:00 AM

Understanding Electrical Safety Testers

Presented by: Chad Clark, Vitrek
Abstract:
Electrical safety testers – often referred to as “hipot” testers get their name from the high-potential (high voltage) they produce to perform dielectric withstand and insulation resistance tests. These testers are an integral part of electrical and electronic equipment manufacturing since electrical safety testing and certification is a requirement for virtually every electronic device and electrical apparatus. Sign up
 
10:00 AM

Reliable Distance Protection Based on Measured Line Parameters & Comprehensive Ground Testing

Presented by: Moritz Pikisch, OMICRON
Abstract:
1) Reliable distance protection based on measured line parameters

Selective distance protection as well as accurate impedance-based fault location highly depends on the accuracy of line parameters, which in this case are the positive-sequence impedance Z1 and the zero-sequence impedance Z0. Very often Z1 and Z0 are calculated based on the conductor geometry and estimated soil properties. This approach is quite accurate for Z1. However, Z0 is highly influenced by unknown soil properties, such as soil resistivity in different soil layers or parallel buried conductors, like gas or water pipes. The measurement of Z1 and Z0 is therefore highly recommended in order to parameterize a distance relay with true line parameters and achieve reliable, selective and accurate performance of the relay. OMICRON’s CPC 100 and CP CU1 allows testing line impedances fast (less than 1 hour), accurately, safely and easily.

2) Comprehensive Ground Testing

All in all, there are four different ground tests which are usually performed in the power industry:

• Soil resistivity, also called Wenner or 4 pin measurement: Performed prior to the design and construction of the ground grid. Needed to determine the multi-layer soil model which is required for ground grid design.
• Ground Potential Rise (GPR), also called fall-of-potential or ground impedance measurement: This measurement is performed to determine the overall impedance between the ground grid and the surrounding soil. The GPR can be compared to the simulated value from the design software (e.g. CDEGS) to verify the quality of the ground grid’s construction. A comparison over time can detect deterioration of the grid.
• Step & touch potential measurement: This measurement is performed according to IEEE 80 in order to ensure human safety in and around substations.
• Point-to-point, also called ground grid continuity or micro-ohm measurement: This measurement verifies if all elements of a ground grid (such as risers) are interconnected with a low resistance. Poor construction or deterioration can be identified with this measurement.

The CPC 100 in conjunction with the CP CU1 and HGT1 as well as the guided workflow software Primary Test Manager (PTM) allow performing all of the mentioned tests. Beside safety, ease of use and accuracy, features like map support, GPS positioning of test points and automated assessment according to relevant standards is supported. Sign up
   
11:00 AM

How the Automotive Market is Evolving

Presented by: Brett Leavitt, Tektronix
Abstract:
  1. In-vehicle network testing
  2. Radar testing
  3. Automotive power electronics testing
  4. Wide Bandgap materials testing
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1:00 PM

Finley Ledbetter, Vacuum Interrupters Inc.

Presented by: Finley Ledbetter, Vacuum Interrupters Inc.
Abstract:
This presentation introduces a recently researched and developed field test procedure used to determine the pressure inside a vacuum interrupter (VI). Basic concepts as well as case histories are included. Many in service VIs have reached or exceeded the projected useful life. This new method allows the field test technician not only to determine vacuum level but also by additional testing at one or more intervals - allow the prediction of remaining life. 
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2:00 PM

Leak Rate Test and Measurement

Presented by: Lou Harrell, Agilent Technologies
Abstract:
Class will provide information on the basics of helium leak detection, types of applications and the proper use and set up of a mass spectrometer helium leak detector. Sign up
 
3:00 PM

Latest Technological Advancements in the Field of Substation Testing

Presented by: Larissa Sargent, Megger
Abstract:
Substation preventive and predictive maintenance is one of the important task for asset managers and power system operators. In this presentation, substation assets such as transformers, circuit breakers, batteries and current transformers will be discussed. Tests recommended in the international standards, best practices to perform those tests and how to analyze the results will be shared. User attending this presentation will develop a better understanding of how to better maintain their assets and take critical decisions based upon data analysis and results interpretation. Sign up


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