MIL-STD-750: Test Methods for Semiconductor Devices
MIL-STD-750 establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in the various parts of this standard cover basic environmental, physical, and electrical tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices. The test methods and procedures described in the various parts of this multipart test method standard have been prepared to serve several purposes:
a. To specify suitable conditions obtainable in the laboratory that give test results equivalent to the actual service conditions existing in the field and to obtain reproducibility of the results of tests. The test methods described by this standard are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic location since it is known that the only true test for operation in a specific location is an actual service test at that point.
b. To describe, in a series of standards, all of the test methods of a similar character which now appear in the various joint-services semiconductor device specifications so that these test methods may be kept uniform and thus result in conservation of equipment, man-hours, and testing facilities. In achieving this objective, it is necessary to make each of the general test methods adaptable to a broad range of devices.
c. The test methods described by this standard for environmental, physical, and electrical testing of semiconductor devices shall also apply, when applicable, to parts not covered by an approved military sheet-form standard, specification sheet, or drawing.
MIL-STD-750F is the current version of this standard and is divided into the following six parts:
MIL-STD-750—Test Methods for Semiconductor Devices (overview document)
MIL-STD-750-1—Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 through 1999
MIL-STD-750-2—Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 through 2999
MIL-STD-750-3—Transistor Electrical Test Methods for Semiconductor Devices Part 3: Test Methods 3000 through 3999
MIL-STD-750-4—Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 through 4999
MIL-STD-750-5—High Reliability Space Application Test Methods for Semiconductor Devices Part 5: Test Methods 5000 through 5999
Last Updated 8/10/17