The Teseq NSG5003 Burst Pulse Generator offers fast transient interference signals injected onto a vehicle’s wiring harness through switching of associated peripheral devices can affect the correct functioning of adjacent electronic units.
In conformance with the standards such as ISO 7637
, the NSG 5003 simulates these interference phenomena by means of pulse bursts. The vibrant development of electronic devices for the automotive industry means that better and faster test methods are demanded continually, particularly in the field of EMC.
Teseq (Schaffner) NSG 5003 Specs
||20 to 800V in 1V steps
|Pulse Rise Time
||100ns (into 50Ω)
||1 to 100kHz in 0.1kHz steps
|Pulses Per Burst
||1 - 200
||90ms to 99.9 seconds in 10ms steps
||Single, continuous, programmed 1 to 99999